Interconnection Reliability Assessment For Electronic Equipment Exposed to Chlorine Dioxide Used For Biological Decontamination
Citation:
Xu, C., D. Fleming, M. L. Mandich, W. D. Reents, G. E. Derkits, J. P. Franey, R. Kopf, AND S. P. RYAN. Interconnection Reliability Assessment For Electronic Equipment Exposed to Chlorine Dioxide Used For Biological Decontamination . In Proceedings, 56th IEEE Holm Conference on Electrical Contacts, Charleston, SC, October 04 - 07, 2010. Institute of Electrical and Electronics Engineers Incorporated (IEEE), Piscataway, NJ, ., (2010).
Impact/Purpose:
This paper focuses on the connector failures due to decontamination and the associated failure mechanisms.
Description:
Symposium Paper
URLs/Downloads:
Interconnection Reliability Assessment For Electronic Equipment Exposed to Chlorine Dioxide Used For Biological Decontamination (PDF, NA pp, 5406 KB, about PDF)Record Details:
Record Type:DOCUMENT( PAPER IN NON-EPA PROCEEDINGS)
Product Published Date:10/06/2010
Record Last Revised:12/11/2013
OMB Category:Other
Record ID:
222452