Main Title |
Scanning probe microscopy of functional materials : nanoscale imaging and spectroscopy / |
Other Authors |
|
Publisher |
Springer, |
Year Published |
2010 |
OCLC Number |
646114105 |
ISBN |
9781441965677; 144196567X |
Subjects |
Scanning probe microscopy ;
Scanning electron microscopy ;
Nanotechnology
|
Internet Access |
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
EKBM |
QH212.S33S397 2010 |
|
Research Triangle Park Library/RTP, NC |
11/07/2011 |
|
Collation |
xviii, 555 pages : illustrations ; 24 cm |
Notes |
Includes bibliographical references and index. |
Contents Notes |
1. Spectroscopic SPM at the resolution limits -- 2. Dynamic spectroscopic SPM -- 3. Thermal Characterization by SPM -- 4. Electrical and electromechanical SPM -- 5. Novel SPM concepts. |
Place Published |
New York |
Access Notes |
Also available online. |
PUB Date Free Form |
c2010 |
BIB Level |
m |
Cataloging Source |
OCLC/T |
OCLC Time Stamp |
20111102092817 |
Language |
eng |
Origin |
OCLC |
Type |
CAT |
OCLC Rec Leader |
01496cam 2200373Ia 45020 |