Main Title |
Practical scanning electron microscopy : electron and ion microprobe analysis / |
Author |
Goldstein, Joseph, ;
Yakowitz, H.
|
Other Authors |
|
Publisher |
Plenum Press, |
Year Published |
1975 |
OCLC Number |
01174600 |
ISBN |
0306308207; 9780306308208 |
Subjects |
Scanning electron microscopy ;
Microprobe analysis ;
Electron Probe Microanalysis ;
Microscopy, Electron, Scanning ;
Rasterelektronenmikroskopie ;
Microscopia ;
Microscopie électronique áa balayage ;
Analyse par microsonde ;
Microscopie âelectronique áa balayage
|
Additional Subjects |
Microprobe analysis ;
Scanning electron microscope
|
Internet Access |
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
EKBM |
QH212.S3G64 1975 |
|
Research Triangle Park Library/RTP, NC |
01/01/1988 |
|
Collation |
xviii, 582 pages : illustrations ; 24 cm |
Notes |
Includes bibliographical references and index. |
Place Published |
New York |
PUB Date Free Form |
1975 |
BIB Level |
m |
Document Type |
BC |
Cataloging Source |
OCLC/T |
LCCN |
74034162 |
Merged OCLC records |
698068390; 985778789; 986075389; 986352255; 989653616; 1086749914; 1113647528 |
OCLC Time Stamp |
20130724114922 |
Language |
eng |
Origin |
OCLC |
Type |
CAT |
OCLC Rec Leader |
02305cam 2200637 i 45020 |