Main Title |
Particle characterization in technology : 2 volumes. |
Author |
Beddow, John K.
|
Publisher |
CRC Press , |
Year Published |
0 |
OCLC Number |
11143470 |
ISBN |
0849357845 (v. 1) 0849357853 (v. 2) |
Additional Subjects |
Particles ;
Particle size determination
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
EKBM |
TA418.78.P36 1984 |
|
Research Triangle Park Library/RTP, NC |
01/01/1988 |
|
Notes |
Volume I: Applications and microanalysis; Volume II: Morphological analysis. Includes bibliographical references and index. |
Place Published |
Boca Raton, Florida : |
PUB Date Free Form |
1984. |
Series Title Traced |
CRC series on fine particle science and technology. |
Document Type |
BC |
Cataloging Source |
OCLC/U |
LCCN |
83014363 |
Origin |
OCLC |
Type |
CAT |