Main Title |
Scanning electron microscopy and x-ray microanalysis / |
Other Authors |
|
Publisher |
Kluwer Academic/Plenum Publishers, |
Year Published |
2003 |
OCLC Number |
50339282 |
ISBN |
0306472929; 9780306472923 |
Subjects |
Scanning electron microscopy ;
X-ray microanalysis ;
Electron Probe Microanalysis ;
Microscopy, Electron, Scanning ;
Rasterelektronenmikroskopie ;
Elektronenstrahlmikroanalyse
|
Internet Access |
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
ESAM |
QH212.S3S29 2003 |
|
Region 10 Library/Seattle,WA |
01/26/2009 |
STATUS |
ESBM |
QH212.S3S29 2003 |
|
CPHEA/PESD Library/Corvallis,OR |
07/30/2012 |
STATUS |
|
Edition |
3rd ed. |
Collation |
xix, 689 p. : ill. (some col.) ; 26 cm. + 1 CD-ROM (4 3/4 in.) |
Notes |
Includes bibliographical references and index. |
Contents Notes |
Accompanying CD-ROM includes ... "a database of useful parameters for SEM and X-ray microanalysis calculations and enhancements to the text chapters."--P. [4] of cover. |
Place Published |
New York |
PUB Date Free Form |
c2003 |
BIB Level |
m |
Cataloging Source |
OCLC/T |
LCCN |
2002028276 |
Merged OCLC records |
988823926; 1049837841; 1054461339; 1058019236; 1127710966; 1171478077; 1302255197; 1303282555 |
OCLC Time Stamp |
20120724154014 |
Language |
eng |
Origin |
OCLC |
Type |
CAT |
OCLC Rec Leader |
03175cam 22005894a 45020 |