Main Title |
Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis / |
Author |
Echlin, Patrick.
|
Publisher |
Springer, |
Year Published |
2009 |
OCLC Number |
248979308 |
ISBN |
9780387857305 (acid-free paper); 0387857303 (acid-free paper) |
Subjects |
Scanning electron microscopy--Technique ;
X-ray microanalysis--Technique ;
Elektronenstrahlmikroanalyse ;
Rasterelektronenmikroskopie ;
Scanning electron microscopy ;
X-ray microanalysis ;
Elektronenstrahlmikroanalyse--(DE-588)4151898-6 ;
Rasterelektronenmikroskopie--(DE-588)4048455-5
|
Internet Access |
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
ESBM |
QH212.S3E24 2009 |
|
CPHEA/PESD Library/Corvallis,OR |
07/30/2012 |
|
Collation |
xi, 330 p. : ill. (some col.) ; 27 cm. |
Notes |
Includes bibliographical references (p. 317-322) and index. |
Contents Notes |
Sample collection and selection -- Sample preparation tools -- Sample support -- Sample embedding and mounting -- Sample exposure -- Sample dehydration -- Sample stabilization for imaging in the SEM -- Sample stabilization to preserve chemical identity -- Sample cleaning -- Sample surface charge elimination -- Sample artifacts and damage -- Additional sources of information. |
Place Published |
New York |
Alternate Title |
Sample preparation for scanning electron microscopy and x-ray microanalysis\ Sample preparation for x-ray microanalysis |
PUB Date Free Form |
c2009 |
BIB Level |
m |
Cataloging Source |
OCLC/T |
LCCN |
2008942785 |
Merged OCLC records |
268799274 |
OCLC Time Stamp |
20120724155146 |
Language |
eng |
Origin |
OCLC |
Type |
CAT |
OCLC Rec Leader |
03101cam 2200685 a 45020 |