Main Title |
Statistical analysis of reliability and life-testing models : theory and methods / |
Author |
Bain, Lee J.,
|
Publisher |
M. Dekker, |
Year Published |
1978 |
OCLC Number |
04442811 |
ISBN |
0824766652; 9780824766658; 0824776194; 9780824776190 |
Subjects |
Reliability (Engineering)--Statistical methods ;
Accelerated life testing ;
Distribution (Probability theory) ;
Mathematical statistics ;
Betrouwbaarheid ;
Verdelingen (statistiek) ;
Statistik ;
Zuverlässigkeit ;
Essais accélérš (technologie) ;
Fiabilité--Méthodes statistiques ;
Distribution (théorie des probabilitš)
|
Internet Access |
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
ELBM |
TS173.B34 1978 |
|
AWBERC Library/Cincinnati,OH |
09/24/1999 |
|
Collation |
xii, 450 pages ; 24 cm. |
Notes |
Includes bibliographical references (pages 429-438) and index. |
Place Published |
New York : |
PUB Date Free Form |
c1978. |
Series Title Traced |
Statistics, textbooks and monographs ; v. 24 |
BIB Level |
m |
Cataloging Source |
OCLC/T |
LCCN |
78010478 //r89 |
Merged OCLC records |
233688308 |
OCLC Time Stamp |
19990921092058 |
Language |
eng |
Origin |
OCLC |
Type |
CAT |
OCLC Rec Leader |
00944cam 2200301 i 45020 |