| Main Title |
Advances in x-ray analysis : proceedings of the 56th annual Conference on Applications of X-ray Analysis (Denver X-ray Conference), 30 July-3 August 2007, Colorado Springs, Colorado, U.S.A. |
| Publisher |
International Centre for Diffraction Data, |
| Year Published |
2008 |
| OCLC Number |
299027176 |
| Subjects |
X-rays--Industrial applications--Congresses
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| ELBM |
TA406.5.A24 2008 v.51 |
|
AWBERC Library/Cincinnati,OH |
04/22/2013 |
|
| Collation |
1 CD-ROM : color ; 4 3/4 in. |
| Notes |
Title from title screen. Includes cumulative title and author index 1-50. |
| Place Published |
Newtown Square, Pa. |
| Access Notes |
System requirements: Windows 98 or newer, Mac OS x 10.3.4 or newer, UNIX/Linux, Adobe Acrobat Reader version 7.0 or newer.; Disc characteristics: CD-ROM. |
| Corporate Au Added Ent |
International Centre for Diffraction Data. |
| Title Ser Add Ent |
Advances in x-ray analysis (1998) ; v. 51. |
| Conference Title |
Conference on Application of X-ray Analysis |
| PUB Date Free Form |
c2008 |
| Series Title Untraced |
Advances in x-ray analysis, v. 51 |
| BIB Level |
m |
| Medium |
electronic resource |
| Cataloging Source |
OCLC/T |
| OCLC Time Stamp |
20130418122039 |
| Language |
eng |
| Origin |
OCLC |
| Type |
CAT |
| OCLC Rec Leader |
01411cam 2200313Ma 45020 |
