| Main Title |
Trace analysis and technological development : special and contributed papers presented at an international symposium held at Bhabha Atomic Research Centre, Bombay (February 16-19, 1981) |
| Author |
Das, M. Sankar.
|
| CORP Author |
John Wiley & Sons.; International Union of Pure and Applied Chemistry. |
| Publisher |
John Wiley & Sons, |
| Year Published |
1983 |
| OCLC Number |
09756750 |
| ISBN |
047027462X |
| Additional Subjects |
Trace elements--Analysis
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| EKBM |
QD139.T7T69 1983 |
|
Research Triangle Park Library/RTP, NC |
01/01/1988 |
| ELBM |
QD139.T7T69 1983 |
|
AWBERC Library/Cincinnati,OH |
01/01/1988 |
|
| Notes |
"Co-sponsorship of the Symposium by the International Union of Pure and Applied Chemistry"--Pref. "Presented at the First International Symposium on Trace Analysis and Technological Development"--Pref. "A Halsted Press book." Includes bibliographical references. |
| Place Published |
New York : |
| Conference Title |
International Symposium on Trace Analysis and Technological Development (1st : 1981 : Bhabha Atomic Research Centre) |
| PUB Date Free Form |
c1983. |
| Document Type |
BC |
| Cataloging Source |
OCLC/U |
| LCCN |
83012788 |
| Origin |
OCLC |
| Type |
CAT |
