| Main Title |
Microanalysis of individual layered particles by secondary ion mass spectrometry / |
| Author |
Newbury, Dale E.
|
| CORP Author |
National Bureau of Standards, Washington, DC.;Environmental Protection Agency, Washington, DC. Office of Environmental Engineering and Technology. |
| Publisher |
National Bureau of Standards, Center for Analytical Chemistry : U.S. Environmental Protection Agency, Office of Environmental Engineering and Technology ; National Technical Information Service [distributor, |
| Year Published |
1980 |
| Report Number |
EPA 600-7-80-122 |
| Stock Number |
PB81-178782 |
| OCLC Number |
42722973 |
| Subjects |
Thin films ;
Fluorescence spectroscopy
|
| Additional Subjects |
Air pollution ;
Microanalysis ;
Particles ;
Molecular structure ;
Chemical composition ;
Sampling ;
Comparison ;
Chemical analysis ;
Glass ;
Secondary ion mass spectroscopy ;
Air pollution detection
|
| Internet Access |
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| EJBD |
EPA 600-7-80-122 |
c.1 |
Headquarters Library/Washington,DC |
06/04/2013 |
| EKBD |
EPA-600/7-80-122 |
|
Research Triangle Park Library/RTP, NC |
02/06/2004 |
| ELBD ARCHIVE |
EPA 600-7-80-122 |
Received from HQ |
AWBERC Library/Cincinnati,OH |
10/04/2023 |
| NTIS |
PB81-178782 |
Some EPA libraries have a fiche copy filed under the call number shown. |
|
07/26/2022 |
|
| Collation |
viii, 58 p. : ill. ; 28 cm. |
| Abstract |
Secondary ion mass spectrometry is evaluated for application to the determination of the composition and structure of individual particles. Analyses of many elemental constituents at the ppm level can be obtained in individual particles as small as micrometers in diameter. Molecular signals, both organic and inorganic, can be detected from particles above 20 micrometers in diameter. Quantitative analyses of elemental constituents can be made with a relative accuracy of 25 percent by means of empirical relative sensitivity factors and within a factor of two by means of a physical model. Multielement depth profiles can be obtained from individual particles as small as 4 micrometers in diameter. Depth profiles of individual particles from SRM 1648 Urban Air Particulate reveal pronounced surface concentrations of lead and barium. Implementation of SIMS depth profiling requires automation to make use of the full spectral information and to eliminate matrix effects by normalization. |
| Notes |
"June 1980"--Cover. Includes bibliographical references. Contract no.: EPA-IAG-D8-E684. |
| Place Published |
Washington, DC Springfield, Va. |
| Access Notes |
Also available via the World Wide Web |
| Corporate Au Added Ent |
Center for Analytical Chemistry (U.S.); United States. Environmental Protection Agency. Office of Environmental Engineering and Technology. |
| Title Ser Add Ent |
Research reporting series. Interagency energy-environment research and development ; EPA-600/7-80-122. |
| PUB Date Free Form |
1980 |
| Series Title Untraced |
Interagency energy/environment R & D program report ; EPA-600/7-80-122 |
| NTIS Prices |
PC A04/MF A01 |
| BIB Level |
m |
| Cataloging Source |
OCLC/T |
| OCLC Time Stamp |
20130927083048 |
| Language |
eng |
| Origin |
OCLC |
| Type |
MERGE |
| OCLC Rec Leader |
01482cam 2200313Ia 45020 |
