| Main Title |
Waste Minimization Audit Report: Case Studies of Minimization of Solvent Waste from Parts Cleaning and from Electronic Capacitor Manufacturing Operations. |
| CORP Author |
Jacobs Engineering Group, Inc., Pasadena, CA.;Environmental Protection Agency, Cincinnati, OH. Hazardous Waste Engineering Research Lab. |
| Year Published |
1987 |
| Report Number |
EPA-68-01-7053; EPA/600/2-87/057; |
| Stock Number |
PB87-227013 |
| Additional Subjects |
Auditing ;
Waste management ;
Solvents ;
Chemical wastes ;
Resource Recovery Acts ;
Waste disposal acts
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| NTIS |
PB87-227013 |
Some EPA libraries have a fiche copy filed under the call number shown. |
|
07/26/2022 |
|
| Collation |
116p |
| Abstract |
To promote waste minimization activities in accordance with the national policy objectives established under the 1984 Hazardous and Solid Waste Amendments to the Resource Conservation and Recovery Act of 1976 (RCRA), the Hazardous Waste Engineering Research Laboratory (HWERL) of the USEPA Office of Research and Development has undertaken a project to develop and test a waste minimization (WM) audit procedure. As part of the project, a total of 6 WM audits were carried out in four separate facilities. The report presents the results of an on-site WM audit performed at an electronic capacitor manufacturing facility for solvent wastes. The report also describes the WM audit procedure as it has developed from the initial (pre-project) sequence of steps, to the modified (post-project) sequence that reflects the experience gained during the HWERL project. |
| Supplementary Notes |
Sponsored by Environmental Protection Agency, Cincinnati, OH. Hazardous Waste Engineering Research Lab. |
| PUB Date Free Form |
Aug 87 |
| Category Codes |
68C |
| NTIS Prices |
PC A06/MF A01 |
| Primary Description |
600/12 |
| Document Type |
NT |
| Cataloging Source |
NTIS/MT |
| Control Number |
730927075 |
| Origin |
NTIS |
| Type |
CAT |
