| Main Title |
Statistical analysis of reliability and life-testing models : theory and methods / |
| Author |
Bain, Lee J.,
|
| Publisher |
M. Dekker, |
| Year Published |
1978 |
| OCLC Number |
04442811 |
| ISBN |
0824766652; 9780824766658; 0824776194; 9780824776190 |
| Subjects |
Reliability (Engineering)--Statistical methods ;
Accelerated life testing ;
Distribution (Probability theory) ;
Mathematical statistics ;
Betrouwbaarheid ;
Verdelingen (statistiek) ;
Statistik ;
Zuverlässigkeit ;
Essais accélérš (technologie) ;
Fiabilité--Méthodes statistiques ;
Distribution (théorie des probabilitš)
|
| Internet Access |
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| ELBM |
TS173.B34 1978 |
|
AWBERC Library/Cincinnati,OH |
09/24/1999 |
|
| Collation |
xii, 450 pages ; 24 cm. |
| Notes |
Includes bibliographical references (pages 429-438) and index. |
| Place Published |
New York : |
| PUB Date Free Form |
c1978. |
| Series Title Traced |
Statistics, textbooks and monographs ; v. 24 |
| BIB Level |
m |
| Cataloging Source |
OCLC/T |
| LCCN |
78010478 //r89 |
| Merged OCLC records |
233688308 |
| OCLC Time Stamp |
19990921092058 |
| Language |
eng |
| Origin |
OCLC |
| Type |
CAT |
| OCLC Rec Leader |
00944cam 2200301 i 45020 |
