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RECORD NUMBER: 27 OF 27

Main Title Short wavelength microscopy /
Other Authors
Author Title of a Work
Parsons, Donald F.
Publisher New York Academy of Sciences,
Year Published 1978
OCLC Number 03730044
ISBN 0890720622; 9780890720622
Subjects Electron microscopy--Congresses ; Scattering (Physics)--Congresses ; Mikroskopie--(DE-588)4039238-7 ; Microscopy, Electron ; Scattering, Radiation ; Microscopy, Electron--Congresses ; Scattering, Radiation--Congresses
Internet Access
Description Access URL
http://www3.interscience.wiley.com/journal/119616951/issue
http://www.blackwell-synergy.com/openurl?genre=journal&stitle=nyas
http://onlinelibrary.wiley.com/doi/10.1111/nyas.1978.306.issue-1/issuetoc
Holdings
Library Call Number Additional Info Location Last
Modified
Checkout
Status
EJEM  Q11.N5 v.306 1978 OCSPP Chemical Library/Washington,DC 07/12/2005
Collation 339 pages : illustrations ; 23 cm.
Notes Papers presented at a workshop held by the New York Academy of Sciences, February 23-25, 1977. Includes bibliographical references.
Place Published New York :
Corporate Au Added Ent New York Academy of Sciences.
Title Ser Add Ent Annals of the New York Academy of Sciences ;
PUB Date Free Form 1978.
Series Title Untraced Annals of the New York Academy of Sciences ; v. 306
BIB Level m
Cataloging Source OCLC/T
LCCN 78003702
Merged OCLC records 456467712; 953564961
OCLC Time Stamp 20050711151558
Language eng
Origin OCLC
Type CAT
OCLC Rec Leader 01219cam 2200337 i 45010