| Main Title |
Short wavelength microscopy / |
| Other Authors |
|
| Publisher |
New York Academy of Sciences, |
| Year Published |
1978 |
| OCLC Number |
03730044 |
| ISBN |
0890720622; 9780890720622 |
| Subjects |
Electron microscopy--Congresses ;
Scattering (Physics)--Congresses ;
Mikroskopie--(DE-588)4039238-7 ;
Microscopy, Electron ;
Scattering, Radiation ;
Microscopy, Electron--Congresses ;
Scattering, Radiation--Congresses
|
| Internet Access |
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| EJEM |
Q11.N5 v.306 1978 |
|
OCSPP Chemical Library/Washington,DC |
07/12/2005 |
|
| Collation |
339 pages : illustrations ; 23 cm. |
| Notes |
Papers presented at a workshop held by the New York Academy of Sciences, February 23-25, 1977. Includes bibliographical references. |
| Place Published |
New York : |
| Corporate Au Added Ent |
New York Academy of Sciences. |
| Title Ser Add Ent |
Annals of the New York Academy of Sciences ; |
| PUB Date Free Form |
1978. |
| Series Title Untraced |
Annals of the New York Academy of Sciences ; v. 306 |
| BIB Level |
m |
| Cataloging Source |
OCLC/T |
| LCCN |
78003702 |
| Merged OCLC records |
456467712; 953564961 |
| OCLC Time Stamp |
20050711151558 |
| Language |
eng |
| Origin |
OCLC |
| Type |
CAT |
| OCLC Rec Leader |
01219cam 2200337 i 45010 |
