| Main Title |
Scanning electron microscopy and x-ray microanalysis / |
| Author |
Lee, Robert Edward.
|
| Publisher |
PTR Prentice Hall, |
| Year Published |
1993 |
| OCLC Number |
25049201 |
| ISBN |
0138137595; 9780138137595 |
| Subjects |
Scanning electron microscopy ;
X-ray microanalysis ;
Elektronenmicroscopie ;
Reontgen-microanalyse ;
Electron Probe Microanalysis ;
Microscopy, Electron, Scanning ;
Microscopie electronique aa balayage ;
Microanalyse par emission X
|
| Internet Access |
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| ELBM |
QH212.S3L44 1993 |
|
AWBERC Library/Cincinnati,OH |
03/08/2010 |
|
| Collation |
xiii, 458 p. : ill. ; 25 cm. |
| Notes |
Includes bibliographical references (p. 439-441) and index. |
| Place Published |
Englewood Cliffs, N.J. |
| PUB Date Free Form |
c1993 |
| BIB Level |
m |
| Cataloging Source |
OCLC/T |
| LCCN |
91045512 |
| Merged OCLC records |
25096493; 28381692; 1022751764; 1057946101; 1065031382; 1083411455; 1086750028 |
| OCLC Time Stamp |
20100301125053 |
| Language |
eng |
| Origin |
OCLC |
| Type |
CAT |
| OCLC Rec Leader |
01731cam 2200529 a 45020 |
