Main Title |
A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films / |
Author |
McCrackin, F. L. ;
McCrackin, Frank L.
|
Other Authors |
|
Publisher |
National Bureau of Standards, |
Year Published |
1964 |
OCLC Number |
09472785 |
Subjects |
Thin films--Optical properties ;
FORTRAN (Computer program language) ;
Solid film--Optical properties
|
Internet Access |
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
ELBM |
QC100.U5753 no.242 |
|
AWBERC Library/Cincinnati,OH |
09/22/1989 |
|
Collation |
ii, 42 pages : diagrams ; 26 cm. |
Notes |
Includes bibliographical references. Issued May 27, 1964. |
Place Published |
Washington : |
Corporate Au Added Ent |
United States. National Bureau of Standards.; United States. Department of Commerce. |
PUB Date Free Form |
1964. |
Series Title Untraced |
NBS technical note ; |
BIB Level |
m |
Cataloging Source |
OCLC/T |
OCLC Time Stamp |
19890911090238 |
Language |
ENG |
Origin |
OCLC |
Type |
CAT |
OCLC Rec Leader |
00840nam 2200217Ia 45020 |