Main Title |
Introduction to analytical electron microscopy / |
Author |
Hren, John J. ;
Goldstein, Joseph ;
Joy, David C.
|
CORP Author |
Electron Microscopy Society of America.; Microbeam Analysis Society. |
Publisher |
Plenum Press, |
Year Published |
1979 |
Report Number |
79017009 |
OCLC Number |
05170974 |
ISBN |
0306402807; 9780306402807 |
Subjects |
Electron microscopy ;
Microscopy, Electron ;
Elektronenmikroskopie ;
Kongress ;
Elektronenmikroskopie--(DE-588)4014327-2 ;
Kongrec
|
Additional Subjects |
Electron microscopy
|
Internet Access |
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
EKBM |
TA417.23.I57 1979 |
|
Research Triangle Park Library/RTP, NC |
01/01/1988 |
|
Collation |
xv, 601 pages : illustrations ; 27 cm |
Notes |
"Proceedings of a workshop on analytical electron microscopy, held in San Antonio, Texas, August 13-14, 1979, as part of the joint meeting of the Electron Microscopy Society of America and the Microbeam Analysis Society." Includes bibliographical references and index. |
Place Published |
New York : |
PUB Date Free Form |
c1979. |
Document Type |
BC |
Cataloging Source |
OCLC/U |
LCCN |
79017009 |
Origin |
OCLC |
Type |
CAT |