| Main Title |
Scanning probe microscopy of functional materials : nanoscale imaging and spectroscopy / |
| Other Authors |
|
| Publisher |
Springer, |
| Year Published |
2010 |
| OCLC Number |
646114105 |
| ISBN |
9781441965677; 144196567X |
| Subjects |
Scanning probe microscopy ;
Scanning electron microscopy ;
Nanotechnology
|
| Internet Access |
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| EKBM |
QH212.S33S397 2010 |
|
Research Triangle Park Library/RTP, NC |
11/07/2011 |
|
| Collation |
xviii, 555 pages : illustrations ; 24 cm |
| Notes |
Includes bibliographical references and index. |
| Contents Notes |
1. Spectroscopic SPM at the resolution limits -- 2. Dynamic spectroscopic SPM -- 3. Thermal Characterization by SPM -- 4. Electrical and electromechanical SPM -- 5. Novel SPM concepts. |
| Place Published |
New York |
| Access Notes |
Also available online. |
| PUB Date Free Form |
c2010 |
| BIB Level |
m |
| Cataloging Source |
OCLC/T |
| OCLC Time Stamp |
20111102092817 |
| Language |
eng |
| Origin |
OCLC |
| Type |
CAT |
| OCLC Rec Leader |
01496cam 2200373Ia 45020 |
