| Main Title |
Particle characterization in technology : 2 volumes. |
| Author |
Beddow, John K.
|
| Publisher |
CRC Press , |
| Year Published |
0 |
| OCLC Number |
11143470 |
| ISBN |
0849357845 (v. 1) 0849357853 (v. 2) |
| Additional Subjects |
Particles ;
Particle size determination
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| EKBM |
TA418.78.P36 1984 |
|
Research Triangle Park Library/RTP, NC |
01/01/1988 |
|
| Notes |
Volume I: Applications and microanalysis; Volume II: Morphological analysis. Includes bibliographical references and index. |
| Place Published |
Boca Raton, Florida : |
| PUB Date Free Form |
1984. |
| Series Title Traced |
CRC series on fine particle science and technology. |
| Document Type |
BC |
| Cataloging Source |
OCLC/U |
| LCCN |
83014363 |
| Origin |
OCLC |
| Type |
CAT |
