Main Title |
Advances in X-ray analysis : Proceedings of the 53rd Annual Conference on Applications of X-ray Analysis [Denver X-ray Conference], 2-6 August 2004, Steamboat Springs, Colorado, U.S.A. / |
Publisher |
International Centre for Diffraction Data, |
Year Published |
2005 |
OCLC Number |
71255609 |
Subjects |
X-rays--Industrial applications--Congresses
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
ELBM |
TA406.5.A24 2005 v.48 |
|
AWBERC Library/Cincinnati,OH |
04/22/2013 |
|
Collation |
1 CD-ROM : color ; 4 3/4 in. |