Main Title |
Advances in x-ray analysis proceedings of the 55th Annual Conference on Applications of X-ray Analysis (Denver X-ray Conference), 7-11 August 2006, Denver, Colorado, U.S.A. [electronic resource] : |
Publisher |
International Centre for Diffraction Data, |
Year Published |
2007 |
OCLC Number |
192029388 |
Subjects |
X-rays--Industrial applications--Congresses
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
ELBM |
TA406.5.A24 2007 v.50 |
|
AWBERC Library/Cincinnati,OH |
04/22/2013 |
|
Collation |
1 CD-ROM : col. ; 4 3/4 in. |
Notes |
Title from title screen. |