Main Title |
Scanning probe microscopy of functional materials : nanoscale imaging and spectroscopy / |
Other Authors |
|
Publisher |
Springer, |
Year Published |
2010 |
OCLC Number |
646114105 |
ISBN |
9781441965677; 144196567X |
Subjects |
Scanning probe microscopy ;
Scanning electron microscopy ;
Nanotechnology
|
Internet Access |
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
EKBM |
QH212.S33S397 2010 |
|
Research Triangle Park Library/RTP, NC |
11/07/2011 |
|
Collation |
xviii, 555 pages : illustrations ; 24 cm |
Notes |
Includes bibliographical references and index. |
Contents Notes |
1. Spectroscopic SPM at the resolution limits -- 2. Dynamic spectroscopic SPM -- 3. Thermal Characterization by SPM -- 4. Electrical and electromechanical SPM -- 5. Novel SPM concepts. |