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RECORD NUMBER: 35 OF 86

OLS Field Name OLS Field Data
Main Title Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis /
Author Echlin, Patrick.
Publisher Springer,
Year Published 2009
OCLC Number 248979308
ISBN 9780387857305 (acid-free paper); 0387857303 (acid-free paper)
Subjects Scanning electron microscopy--Technique. ; X-ray microanalysis--Technique. ; Elektronenstrahlmikroanalyse. ; Rasterelektronenmikroskopie. ; Scanning electron microscopy. ; X-ray microanalysis. ; Elektronenstrahlmikroanalyse.--(DE-588)4151898-6 ; Rasterelektronenmikroskopie.--(DE-588)4048455-5
Internet Access
Description Access URL
Table of contents http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=017081073&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=017081073&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA
Holdings
Library Call Number Additional Info Location Last
Modified
Checkout
Status
ESBM  QH212.S3E24 2009 NHEERL/WED Library/Corvallis,OR 07/30/2012 STATUS
Collation xi, 330 p. : ill. (some col.) ; 27 cm.
Notes
Includes bibliographical references (p. 317-322) and index.
Contents Notes
Sample collection and selection -- Sample preparation tools -- Sample support -- Sample embedding and mounting -- Sample exposure -- Sample dehydration -- Sample stabilization for imaging in the SEM -- Sample stabilization to preserve chemical identity -- Sample cleaning -- Sample surface charge elimination -- Sample artifacts and damage -- Additional sources of information.