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RECORD NUMBER: 3 OF 5

OLS Field Name OLS Field Data
Main Title Empirical Background Calculation Method for Multi-Channel X-ray Spectrometers.
Author Kellogg, R. B. ;
CORP Author Northrop Services, Inc., Research Triangle Park, NC.;Environmental Sciences Research Lab., Research Triangle Park, NC.
Year Published 1983
Report Number EPA-68-02-4033; EPA-600/D-84-028;
Stock Number PB84-130475
Additional Subjects X ray spectrometers ; Chemical analysis ; Rayleigh scattering ; Compton effect ; Concentration(Composition) ; Environmental surveys ; Sampling ; Standards ; Standard reference materials ; Numerical solution
Holdings
Library Call Number Additional Info Location Last
Modified
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Status
NTIS  PB84-130475 Most EPA libraries have a fiche copy filed under the call number shown. Check with individual libraries about paper copy. 06/23/1988
Collation 19p
Abstract
A method of background calculation has been developed which is applicable to fixed-channel wavelength-dispersive spectrometers which cannot directly measure background. The x-ray intensities from a set of high- and low-average atomic number standards are fitted against Rayleigh and Compton scatter parameters to an equation of the form: y - a (x sub 1) + b (x sub 2) + c. Y is the calculated intensity, x(1) and x(2) are Rayleigh and Compton scatter parameters, and c is a constant. Correlation coefficients greater than 0.99 and slopes of 1.00 are obtained for most elements measured. Calculated and measured backgrounds as well as concentrations are reported for selected standard reference materials.