Main Title |
Development of X-ray fluorescence Spectroscopy for Elemental Analysis of Particulate Matter in the Atmosphere and in Source Emissions. Phase II: Evaluation of Commercial Multiple Crystal Spectrometer Instruments. |
Author |
Birk, L. S. ;
Gilfric, J. V. ;
|
CORP Author |
Naval Research Lab, Washington, D.C. |
Year Published |
1973 |
Report Number |
NRL-7617; NRL-P04-06; |
Stock Number |
AD-762 061/0 |
Additional Subjects |
Air pollution ;
Particles ;
Aerosols ;
X-ray spectroscopy ;
Sensitivity ;
Crystals ;
Nuclear radiation spectrometers ;
Air pollution detection ;
Comparison ;
Trace elements ;
X ray fluorescence ;
X ray spectrometers ;
X ray analysis ;
N
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
NTIS |
AD-762 061/0 |
Some EPA libraries have a fiche copy filed under the call number shown. |
|
07/26/2022 |
|
Collation |
13p |
Abstract |
Four commercial multiple crystal spectrometer X-ray analyzers were evaluated for use in the elemental analysis of air pollution particulate samples. Fourteen to twenty-four elements can be measured simultaneously in these instruments. 100 second detection limits of 1 to 10 ng/sq cm were achieved for about one-half of the elements examined. Any one of the commercial instruments is capable of performing quantitative analysis of the particulate matter filtered out of the atmosphere or source emissions. Some actual pollution samples were analyzed in all four instruments to demonstrate suitability. (Author) |