This verification test was designed to evaluate technologies that detect and measure lead in dust wipes. The test was conducted at the Oak Ridge National Laboratory in Oak Ridge, TN, from January 7 through January 9, 2002. KeyMaster Technologies, a vendor of commercially-available, field portable x-ray fluorescence (XRF) instruments for lead detection and measurement, blindly analyzed 160 dust wipe samples containing known amounts of lead, ranging in concentration from 2 to 1,500 micro g/wipe. The experimental design was particularly focused on important clearance standards, such as those identified in 40 CFR Part 745.227(e)(8)(viii) of 40 microgram/sq.ft. for floors, 250 microgram/sq.ft. for window sills, and 400 microgram/sq.ft. for window troughs. The samples included wipes newly-prepared and archived from the Environmental Lead Proficiency Analytical Testing Program (ELPAT). These samples were prepared from dust collected in households in North Carolina and Wisconsin. Also, newly-prepared samples were acquired from the University of Cincinnati (UC). The (UC) dust wipe samples were prepared from National Institute of Standards and Technology (NIST) Standard Reference Materials (SRMs). Details of the test, including a data summary and discussion of results, may be found in the report.