| Main Title |
The development of potential thin standards for calibration of x-ray fluorescence spectrometry / |
| Author |
Pella, P. A.
|
| CORP Author |
National Bureau of Standards, Washington, DC. National Measurement Lab.;Environmental Protection Agency, Washington, DC. Office of Research and Development. |
| Publisher |
National Bureau of Standards, Center for Analytical Chemistry : U.S. Environmental Protection Agency, Office of Environmental Engineering and Technology ; National Technical Information Service [distributor], |
| Year Published |
1980 |
| Report Number |
EPA/600-7-80-123 |
| Stock Number |
PB80-220239 |
| OCLC Number |
08349920 |
| Subjects |
Thin films ;
Fluorescence spectroscopy
|
| Additional Subjects |
Gas analysis ;
X ray spectrometers ;
X ray fluorescence ;
Standards ;
Calibrating ;
Sampling ;
Thin films ;
Air pollution ;
Glass fibers ;
Chemical analysis ;
Air pollution detection
|
| Internet Access |
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| EJBD |
EPA 600-7-80-123 |
c.1 |
Headquarters Library/Washington,DC |
06/04/2013 |
| ELBD ARCHIVE |
EPA 600-7-80-123 |
Received from HQ |
AWBERC Library/Cincinnati,OH |
10/04/2023 |
| NTIS |
PB80-220239 |
Some EPA libraries have a fiche copy filed under the call number shown. |
|
07/26/2022 |
|
| Collation |
vii, 39 pages : illustrations ; 28 cm. |
| Abstract |
Thin films containing known concentrations of metals are important for the calibration of X-ray Fluorescence Spectrometry (XRF), especially for the analysis of collected airborne particulate matter. A focused ion-beam sputtering technique has been investigated as a candidate method for fabricating thin glass films containing know concentrations of metals on polycarbonate substrates. Glass targets were fabricated at NBS for these studies, and parameters such as ion-acceleration voltage and ion current were systematically varied to determine any changes in film composition. It was found that rather severe changes in instrumental parameters do not affect the elemental composition of the films appreciably. Up to eight substrates were coated at one time and the compositional reproducibility as measured by XRF for Si, Ca, Zn, and Pb for 13 samples was within five percent relative standard deviation at mass loadings of glass from 160 190 micrograms/cm. Glass films containing phosphorous and sulfur were also prepared to demonstrate the feasibility of preparing glass films containing such elements of low atomic number. Additional studies consisted of the deposition of finely ground synthetic glasses on membrane filters, and the characterization of some selected commercial thin films prepared by thermal evaporation. |
| Notes |
"June 1980." "EPA/600-7-80-123." Includes bibliographical references. Contract no.: EPA-IAG-D8-E684. |
