Record Display for the EPA National Library Catalog

RECORD NUMBER: 23 OF 35

OLS Field Name OLS Field Data
Main Title Microanalysis of individual layered particles by secondary ion mass spectrometry /
Author Newbury, Dale E.
CORP Author National Bureau of Standards, Washington, DC.;Environmental Protection Agency, Washington, DC. Office of Environmental Engineering and Technology.
Publisher National Bureau of Standards, Center for Analytical Chemistry : U.S. Environmental Protection Agency, Office of Environmental Engineering and Technology ; National Technical Information Service [distributor,
Year Published 1980
Report Number EPA 600-7-80-122
Stock Number PB81-178782
OCLC Number 42722973
Subjects Thin films. ; Fluorescence spectroscopy.
Additional Subjects Air pollution ; Microanalysis ; Particles ; Molecular structure ; Chemical composition ; Sampling ; Comparison ; Chemical analysis ; Glass ; Secondary ion mass spectroscopy ; Air pollution detection
Internet Access
Description Access URL
https://nepis.epa.gov/Exe/ZyPDF.cgi?Dockey=9101HI3Q.PDF
Holdings
Library Call Number Additional Info Location Last
Modified
Checkout
Status
EJBD ARCHIVE EPA 600-7-80-122 Headquarters Library/Washington,DC 09/12/2011
EJBD  EPA 600-7-80-122 c.1 Headquarters Library/Washington,DC 06/04/2013
EKBD  EPA-600/7-80-122 Research Triangle Park Library/RTP, NC 02/06/2004
EOBD  EPA 600-7-80-122 NEIC Library/Denver,CO 11/05/1999
NTIS  PB81-178782 Most EPA libraries have a fiche copy filed under the call number shown. Check with individual libraries about paper copy. NTIS 01/01/1988
Collation viii, 58 p. : ill. ; 28 cm.
Abstract
Secondary ion mass spectrometry is evaluated for application to the determination of the composition and structure of individual particles. Analyses of many elemental constituents at the ppm level can be obtained in individual particles as small as micrometers in diameter. Molecular signals, both organic and inorganic, can be detected from particles above 20 micrometers in diameter. Quantitative analyses of elemental constituents can be made with a relative accuracy of 25 percent by means of empirical relative sensitivity factors and within a factor of two by means of a physical model. Multielement depth profiles can be obtained from individual particles as small as 4 micrometers in diameter. Depth profiles of individual particles from SRM 1648 Urban Air Particulate reveal pronounced surface concentrations of lead and barium. Implementation of SIMS depth profiling requires automation to make use of the full spectral information and to eliminate matrix effects by normalization.
Notes
"June 1980"--Cover. Includes bibliographical references. Contract no.: EPA-IAG-D8-E684.