| Main Title |
Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films |
| Author |
McCrackin, Frank L.
|
| Other Authors |
|
| Publisher |
Dept. of Commerce, National Bureau of Standards : U.S.G.P.O., |
| Year Published |
1964 |
| OCLC Number |
09472785 |
| Subjects |
Solid film--Optical properties ;
FORTRAN (Computer program language)
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| ELBM |
QC100.U5753 no.242 |
|
AWBERC Library/Cincinnati,OH |
09/22/1989 |
|
| Collation |
ii, 42 p. : charts ; 26 cm. |
| Notes |
Includes bibliography. |
