Main Title |
Trace characterization, chemical and physical / |
Author |
Meinke, W. Wayne ;
Scribner, Bourdon Francis
|
Other Authors |
|
CORP Author |
United States. National Bureau of Standards. Institute for Materials Research. |
Publisher |
Dept. of Commerce, National Bureau of Standards, |
Year Published |
1967 |
OCLC Number |
00425883 |
Subjects |
Analytical chemistry--Congresses ;
Chimie ;
Congrès ;
Chimie analytique
|
Additional Subjects |
Chemistry, Analytic--Congresses
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
EKBM |
QC100.U556 no.100 |
|
Research Triangle Park Library/RTP, NC |
01/01/1988 |
|
Collation |
xiii, 580 pages : illustrations ; 25 cm. |
Notes |
"Based on lectures and discussions of the 1st Materials Research Symposium held at the NBS, Gaithersburg, Maryland, October 3-7, 1966." Includes bibliographical references. |
Contents Notes |
Trace characterization and the properties of materials / Hannay, N.B. -- Electrical measurements for trace characterization / Weisberg, L.R. -- Trace characterization by electrochemical methods / Laitinen, H.A. -- Optical and x-ray spectroscopy / Addink, N.W.H. -- Effects of trace impurities on x-ray diffraction / Chikawa, J, and Newkirk, J.B. -- Chemical spectrophotometry in trace characterization / West, T.S. -- Radioactivity techniques in trace characterization / Smales, A.A. -- Spark source mass spectrometric analysis of solids / Ahearn, A.J. -- Preconcentration in trace analysis / Minczewski, J. -- The study of crystal imperfections by means of optical methods and by means of electron microscopy and electron diffraction / Amelinckx, S. |