Main Title |
X-ray diffraction procedures for polycrystalline and amorphous materials / |
Author |
Klug, Harold P. ;
Klug, Harold Philip
|
Other Authors |
|
Publisher |
John Wiley & Sons, |
Year Published |
1974 |
OCLC Number |
00793520 |
ISBN |
0471493694; 9780471493693 |
Subjects |
X-rays--Diffraction ;
X-Ray Diffraction ;
Amorpher Festkèorper ;
Polykristall ;
Rèontgenstrukturanalyse ;
Rèontgendiffractie ;
Polykristallijne stoffen ;
Amorf materiaal
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
EKBM |
QC482.D5K55 1974 |
|
Research Triangle Park Library/RTP, NC |
08/31/2011 |
|
Edition |
2d ed. |
Collation |
xxv, 966 pages : illustrations ; 23 cm |
Notes |
"A Wiley-Interscience publication." Includes bibliographical references and indexes. |
Contents Notes |
Elementary crystallography -- The production and properties of x-rays -- Fundamental principles of x-ray diffraction -- Photographic powder techniques -- Diffractometric powder technique -- The interpretation of powder diffraction data -- Qualitative and quantitative analysis of crystalline powders -- The precision determination of lattice constants -- Crystallite size and lattice stains from line broadening -- Investigation of preferred orientation and texture -- Stress measurement in metals -- Radial-distribution studies of noncrystalline materials -- Appendix I. Layout for a diffraction laboratory -- Appendix II. The handling and processing of x-ray film -- Appendix III. Miscellaneous constants and numerical data -- Appendix IV. International atomic weights -- Appendix V. Mass absorption coefficients µ/p of the elements (Z=1 to 83) for a selection of wavelengths -- Appendix VI. Quadratic forms for the cubic system -- Appendix VII. Atomic and ionic scattering factors -- Appendix VIII. Lorentz and polarization factors -- Appendix IX. Temperature factor table -- Appendix X. Warren's powder pattern power theorem -- Author index -- Subject index. |