Record Display for the EPA National Library Catalog

RECORD NUMBER: 39 OF 74

OLS Field Name OLS Field Data
Main Title Ion Beam Etching Effects in Biological Microanalysis.
Author Linton, R. W. ; Farmer, M. E. ; Ingram, P. ; Walker, S. R. ; Shelburne, J. D. ;
CORP Author North Carolina Univ. at Chapel Hill. Dept. of Chemistry. ;Research Triangle Inst., Research Triangle Park, NC. ;Duke Univ. Medical Center, Durham, NC. Dept. of Pathology.;Health Effects Research Lab., Research Triangle Park, NC.
Year Published 1982
Report Number EPA-R-807560; EPA/600/J-82/453;
Stock Number PB86-137023
Additional Subjects Surface chemistry ; Bioassay ; Ion beams ; Etching ; Sputtering ; Cells(Biology) ; Samples ; Membranes ; Reprints ; Secondary ion mass spectroscopy ; Ion beam sputtering etching techniques ; Ion microanalyzers
Holdings
Library Call Number Additional Info Location Last
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Status
NTIS  PB86-137023 Most EPA libraries have a fiche copy filed under the call number shown. Check with individual libraries about paper copy. NTIS 06/21/1988
Collation 15p
Abstract
Oxygen ion beam sputter etching used in SIMS has been shown to produce morphologic effects which have similarities and differences in comparison to rf plasma etching of biological specimens. Sputter yield variations resulting from structural microheterogeneity are illustrated (e.g. etch-resistant nucleoli in preferentially etched nuclei), including their impact upon ion image formation in an ion microanalyzer. These image artifacts must be evaluated before secondary ion images revealing subcellular organelles can be related quantitatively to elemental localization in cells or tissues. To minimize gross surface roughness effects such as cone formation induced by ion bombardment, ion imaging studies of thin sections using low primary ion doses are indicated.