Main Title |
A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films / |
Author |
McCrackin, F. L. ;
McCrackin, Frank L.
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Other Authors |
|
Publisher |
National Bureau of Standards, |
Year Published |
1964 |
OCLC Number |
09472785 |
Subjects |
Thin films--Optical properties ;
FORTRAN (Computer program language) ;
Solid film--Optical properties
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Internet Access |
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
ELBM |
QC100.U5753 no.242 |
|
AWBERC Library/Cincinnati,OH |
09/22/1989 |
|
Collation |
ii, 42 pages : diagrams ; 26 cm. |
Notes |
Includes bibliographical references. Issued May 27, 1964. |