||Correlative Light, Electron, and Ion Microscopy on a Single Histologic Section.
Kupke, K. G. ;
Pickett, J. P. ;
Ingram, P. ;
Griffis, D. P. ;
Linton, R. W. ;
||Duke Univ. Medical Center, Durham, NC. ;Veterans Administration Medical Center, Durham, NC. ;North Carolina Univ. at Chapel Hill. Dept. of Chemistry. ;Research Triangle Inst., Research Triangle Park, NC.;Health Effects Research Lab., Research Triangle Park, NC.
Electron microscopy ;
Ion microscopy ;
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In order to best interpret the chemical images obtained using new microanalytical techniques such as ion microscopy (IM), it is advantageous to correlate them with the morphologic/chemical information provided by more conventional light microscopy (LM), secondary electron imaging (SEI), backscattered electron imaging (BEI), or electron probe microanalysis (EPMA). Accordingly the authors have devised a technique of specimen preparation which allows for the application of several different microanalytical techniques to a single histologic section mounted on the same substrate.