Record Display for the EPA National Library Catalog

RECORD NUMBER: 29 OF 32

OLS Field Name OLS Field Data
Main Title The physics of interface interactions related to reliability of future electronics devices.
Other Authors
Author Title of a Work
DiStefano, Thomas H.
Tu, King-Ning.
Publisher Defense Technical Information Center.
Year Published 1974
Report Number AD-A001 977; AFCRL-TR-74-0263; F19628-73-C-0006
OCLC Number 905969651
Holdings
Library Call Number Additional Info Location Last
Modified
Checkout
Status
EKBD  AD-A001 977 Microfiche collection Research Triangle Park Library/RTP, NC 04/06/2015
Collation 94 pages.
Notes
See also AD-781 820. "AD-A001 977." "AFCRL-TR-74-0263." "F19628-73-C-0006." Microfiche.
Contents Notes
;Contents: The reliability of semiconductor-insulator interfaces--Photon induced dielectric breakdown in SiO2, and Photon assisted tunneling in internal photoemission I. theory; Band structure and switching in metal oxide insulators--Electronic contact barriers and morphology of Nb2O5 thin films, and Electronic structure of the SiO2:Si3N4 interface; Instabilities associated with metal-glass interaction--Surface reactions on MOS structures, Densification of SiO2 by exposure to an ion beam, and Epitaxial growth of Nickel Silicide NiSi2 on Silicon.