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OLS Field Name OLS Field Data
Main Title Laboratory evaluation of six new/modified portable x-ray fluorscence spectrometers for the measurement of lead in characterized paint films and research material boards /
Author Williams, E. E. ; Clayton, C. A. ; Hardison, E. D. ; Gutknecht, W. F.
Other Authors
Author Title of a Work
Clayton, C. Andrew.
Hardison, E. D.
Gutknecht, W. F.
CORP Author Research Triangle Inst., Research Triangle Park, NC.;Environmental Protection Agency, Research Triangle Park, NC. National Exposure Research Lab.
Publisher U.S. Environmental Protection Agency, Office of Research and Development, National Exposure Research Laboratory,
Year Published 1999
Report Number EPA/600/R-97/100a; NERL-RTP-O-506; EPA-68-02-4544; EPA-68-D5-0040
Stock Number PB99-162471
Additional Subjects X-ray fluorescence analyzers ; Spectroscopic analysis ; Lead(Metal) ; Paints ; Fiberboards ; Portable equipment ; Labortatory test ; X-ray spectrometers ; X-ray spectroscopy ; Detectors ; Films ; Substrates ; Performance evaluation ; Quantitative analysis ; Qualitative analysis ; Performance test ; Screening ; Statistical analysis ; Standard reference materials ; AREAL(Atmospheric Research and Exposure Assessment Laboratory) ; RTI(Research Triangle Institute)
Holdings
Library Call Number Additional Info Location Last
Modified
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Status
NTIS  PB99-162471 Most EPA libraries have a fiche copy filed under the call number shown. Check with individual libraries about paper copy. NTIS 01/01/1988
Collation 338 pages : illustrations ; 28 cm
Abstract
This report describes a study performed as part of step three of the AREAL technology evaluation in 1994-1995 by RTI. The study's purpose was to identify and estimate the influence of key characteristics for evaluating the performances of portable X-ray fluorescence (XRF) spectrometers of various configurations and software. RTI evaluated the performance of the following spectrometers that were either new to the market in 1994 or were modifications of an existing model: HNU SEFA-Pb (HNU Systems, Newton, MA), K- and L-shells; Metorex X-MET 880 (Metorex, Inc., Bend, OR), L-shell; Niton XL (Niton Corporation, Bedford, MA), L-shell; Radiation Monitoring Devices; (RMD) Lead Paint Analyzer-1 (LPA-1)(Radiation Monitoring Devices, Inc., Watertown, MA), K-shell; TN Technologies Pb Analyzer (TN Technologies, Round Rock, TX), K- and L-shells; and Xsirius (now Avanced Detectors) LeadStar (Xsirius, Camarillo, CA), K- and L-Shells; The study was divided into two parts--a screening analysis and a comprehensive or full analysis. the screening analysis was performed to identify any major problems associated with spectrometric measurements.
Notes
"April 1999." "Contract no. 68-D5-0040, RW86937727." Includes bibliographical references." Microfiche.