| Main Title |
Advances in x-ray analysis : proceedings of the 56th annual Conference on Applications of X-ray Analysis (Denver X-ray Conference), 30 July-3 August 2007, Colorado Springs, Colorado, U.S.A. |
| Publisher |
International Centre for Diffraction Data, |
| Year Published |
2008 |
| OCLC Number |
299027176 |
| Subjects |
X-rays--Industrial applications--Congresses
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| ELBM |
TA406.5.A24 2008 v.51 |
|
AWBERC Library/Cincinnati,OH |
04/22/2013 |
|
| Collation |
1 CD-ROM : color ; 4 3/4 in. |
| Notes |
Title from title screen. Includes cumulative title and author index 1-50. |
