| Main Title |
Investigation of H2, O2 and H2O with Ni, depth profile of implanted H+ in ZnO and quantitative analysis of fly ash by means of SIMS / |
| Author |
Shenasa, Mohsen.
|
| Year Published |
1988 |
| OCLC Number |
19993807 |
| Subjects |
Secondary ion mass spectrometry ;
Fly ash--Analysis
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| ELBM |
QD96.S43S54 1988 |
|
AWBERC Library/Cincinnati,OH |
07/13/1991 |
|
| Collation |
xiii, 172 leaves : illustrations ; 29 cm |
| Notes |
Vita. Includes bibliographical references. Photocopy (positive)--University Microfilms No. 89-04677. |
