Record Display for the EPA National Library Catalog
RECORD NUMBER: 1 OF 1Main Title | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis / | ||||||||||||
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Author | Echlin, Patrick. | ||||||||||||
Publisher | Springer, | ||||||||||||
Year Published | 2009 | ||||||||||||
OCLC Number | 248979308 | ||||||||||||
ISBN | 9780387857305 (acid-free paper); 0387857303 (acid-free paper) | ||||||||||||
Subjects | Scanning electron microscopy--Technique ; X-ray microanalysis--Technique ; Elektronenstrahlmikroanalyse ; Rasterelektronenmikroskopie ; Scanning electron microscopy ; X-ray microanalysis ; Elektronenstrahlmikroanalyse--(DE-588)4151898-6 ; Rasterelektronenmikroskopie--(DE-588)4048455-5 | ||||||||||||
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Collation | xi, 330 p. : ill. (some col.) ; 27 cm. | ||||||||||||
Notes | Includes bibliographical references (p. 317-322) and index. |
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Contents Notes | Sample collection and selection -- Sample preparation tools -- Sample support -- Sample embedding and mounting -- Sample exposure -- Sample dehydration -- Sample stabilization for imaging in the SEM -- Sample stabilization to preserve chemical identity -- Sample cleaning -- Sample surface charge elimination -- Sample artifacts and damage -- Additional sources of information. |