Record Display for the EPA National Library Catalog

RECORD NUMBER: 20 OF 26

OLS Field Name OLS Field Data
Main Title Scanning electron microscopy and x-ray microanalysis /
Other Authors
Author Title of a Work
Goldstein, Joseph,
Publisher Kluwer Academic/Plenum Publishers,
Year Published 2003
OCLC Number 50339282
ISBN 0306472929; 9780306472923
Subjects Scanning electron microscopy. ; X-ray microanalysis. ; Electron Probe Microanalysis. ; Microscopy, Electron, Scanning. ; Rasterelektronenmikroskopie. ; Elektronenstrahlmikroanalyse.
Internet Access
Description Access URL
http://www.loc.gov/catdir/enhancements/fy0813/2002028276-d.html
Publisher description http://catdir.loc.gov/catdir/enhancements/fy0813/2002028276-d.html
Table of contents http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=009945332&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
Holdings
Library Call Number Additional Info Location Last
Modified
Checkout
Status
EOBM  QH212.S3S29 2003 c.2 SEM Lab NEIC Library/Denver,CO 01/26/2012
ESAM  QH212.S3S29 2003 Region 10 Library/Seattle,WA 01/26/2009 STATUS
ESBM  QH212.S3S29 2003 CPHEA/PESD Library/Corvallis,OR 07/30/2012 STATUS
Edition 3rd ed.
Collation xix, 689 p. : ill. (some col.) ; 26 cm. + 1 CD-ROM (4 3/4 in.)
Notes
Includes bibliographical references and index.
Contents Notes
Accompanying CD-ROM includes ... "a database of useful parameters for SEM and X-ray microanalysis calculations and enhancements to the text chapters."--P. [4] of cover.