Main Title |
Scanning electron microscopy and x-ray microanalysis / |
Other Authors |
|
Publisher |
Kluwer Academic/Plenum Publishers, |
Year Published |
2003 |
OCLC Number |
50339282 |
ISBN |
0306472929; 9780306472923 |
Subjects |
Scanning electron microscopy ;
X-ray microanalysis ;
Electron Probe Microanalysis ;
Microscopy, Electron, Scanning ;
Rasterelektronenmikroskopie ;
Elektronenstrahlmikroanalyse
|
Internet Access |
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
ESAM |
QH212.S3S29 2003 |
|
Region 10 Library/Seattle,WA |
01/26/2009 |
STATUS |
ESBM |
QH212.S3S29 2003 |
Missing 8/14/2024 |
CPHEA/PESD Library/Corvallis,OR |
08/14/2024 |
|
Edition |
3rd ed. |
Collation |
xix, 689 p. : ill. (some col.) ; 26 cm. + 1 CD-ROM (4 3/4 in.) |
Notes |
Includes bibliographical references and index. |
Contents Notes |
Accompanying CD-ROM includes ... "a database of useful parameters for SEM and X-ray microanalysis calculations and enhancements to the text chapters."--P. [4] of cover. |