| Main Title |
Scanning electron microscopy and x-ray microanalysis / |
| Author |
Lee, Robert Edward.
|
| Publisher |
PTR Prentice Hall, |
| Year Published |
1993 |
| OCLC Number |
25049201 |
| ISBN |
0138137595; 9780138137595 |
| Subjects |
Scanning electron microscopy. ;
X-ray microanalysis. ;
Elektronenmicroscopie. ;
Rèontgen-microanalyse. ;
Electron Probe Microanalysis. ;
Microscopy, Electron, Scanning. ;
Microscopie âelectronique áa balayage. ;
Microanalyse par âemission X.
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| ELBM |
QH212.S3L44 1993 |
|
AWBERC Library/Cincinnati,OH |
03/08/2010 |
| EOBM |
QH212.S3L44 1993 |
|
NEIC Library/Denver,CO |
05/13/1994 |
STATUS |
|
| Collation |
xiii, 458 p. : ill. ; 25 cm. |
| Notes |
Includes bibliographical references (p. 439-441) and index. |
