Main Title |
Practical scanning electron microscopy : electron and ion microprobe analysis / |
Author |
Goldstein, Joseph, ;
Yakowitz, H.
|
Other Authors |
|
Publisher |
Plenum Press, |
Year Published |
1975 |
OCLC Number |
01174600 |
ISBN |
0306308207; 9780306308208 |
Subjects |
Scanning electron microscopy. ;
Microprobe analysis. ;
Electron Probe Microanalysis. ;
Microscopy, Electron, Scanning. ;
Rasterelektronenmikroskopie ;
Microscopia. ;
Microscopie électronique áa balayage. ;
Analyse par microsonde. ;
Microscopie âelectronique áa balayage.
|
Additional Subjects |
Microprobe analysis ;
Scanning electron microscope
|
Internet Access |
|
Holdings |
Library |
Call Number |
Additional Info |
Location |
Last Modified |
Checkout Status |
EKBM |
QH212.S3G64 1975 |
|
Research Triangle Park Library/RTP, NC |
01/01/1988 |
|
Collation |
xviii, 582 pages : illustrations ; 24 cm |
Notes |
Includes bibliographical references and index. |