| Main Title |
Practical scanning electron microscopy : electron and ion microprobe analysis / |
| Author |
Goldstein, Joseph, ;
Yakowitz, H.
|
| Other Authors |
|
| Publisher |
Plenum Press, |
| Year Published |
1975 |
| OCLC Number |
01174600 |
| ISBN |
0306308207; 9780306308208 |
| Subjects |
Scanning electron microscopy ;
Microprobe analysis ;
Electron Probe Microanalysis ;
Microscopy, Electron, Scanning ;
Rasterelektronenmikroskopie ;
Microscopia ;
Microscopie electronique aa balayage ;
Analyse par microsonde ;
Microscopie electronique aa balayage
|
| Additional Subjects |
Microprobe analysis ;
Scanning electron microscope
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| EKBM |
QH212.S3G64 1975 |
|
Research Triangle Park Library/RTP, NC |
01/01/1988 |
|
| Collation |
xviii, 582 pages : illustrations ; 24 cm |
| Notes |
Includes bibliographical references and index. |
