| Main Title |
Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis / |
| Author |
Echlin, Patrick.
|
| Publisher |
Springer, |
| Year Published |
2009 |
| OCLC Number |
248979308 |
| ISBN |
9780387857305 (acid-free paper); 0387857303 (acid-free paper) |
| Subjects |
Scanning electron microscopy--Technique ;
X-ray microanalysis--Technique ;
Elektronenstrahlmikroanalyse ;
Rasterelektronenmikroskopie ;
Scanning electron microscopy ;
X-ray microanalysis ;
Elektronenstrahlmikroanalyse--(DE-588)4151898-6 ;
Rasterelektronenmikroskopie--(DE-588)4048455-5
|
| Internet Access |
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| ESBM |
QH212.S3E24 2009 |
8/14/2024 |
CPHEA/PESD Library/Corvallis,OR |
08/14/2024 |
|
| Collation |
xi, 330 p. : ill. (some col.) ; 27 cm. |
| Notes |
Includes bibliographical references (p. 317-322) and index. |
| Contents Notes |
Sample collection and selection -- Sample preparation tools -- Sample support -- Sample embedding and mounting -- Sample exposure -- Sample dehydration -- Sample stabilization for imaging in the SEM -- Sample stabilization to preserve chemical identity -- Sample cleaning -- Sample surface charge elimination -- Sample artifacts and damage -- Additional sources of information. |
