Record Display for the EPA National Library Catalog
RECORD NUMBER: 1 OF 1| Main Title | Elements of x-ray diffraction / | |||||||||||
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| Author | Cullity, B. D. | |||||||||||
| Publisher | Addison-Wesley Publishing Company, Inc., | |||||||||||
| Year Published | 1978 | |||||||||||
| Report Number | 77073950 | |||||||||||
| OCLC Number | 03672627 | |||||||||||
| ISBN | 0201011743; 9780201011746 | |||||||||||
| Subjects | X-rays--Diffraction ; Chemische Analyse ; Kristall ; Rèontgenbeugung ; Rèontgenstrukturanalyse ; Rayons X--Diffraction ; Einfèuhrung ; Kristallstrukturanalyse ; Rèontgenographie | |||||||||||
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| Edition | 2d ed. | |||||||||||
| Collation | xii, 555 pages : illustrations ; 25 cm. | |||||||||||
| Notes | Includes bibliographical references (pages 529-542) and index. |
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| Contents Notes | Fundamentals. Properties of x-rays -- Geometry of crystals -- Diffraction I: direction of diffracted beams -- Diffraction II: intensities of diffracted beams -- Experimental methods -- Laue photographs -- Powder photographs -- Diffractometer and spectrometer measurements -- Applications. Orientation and quality of single crystals -- Structure of polycrystalline aggregates -- Determination of crystal structure -- Precise parameter measurements -- Phase-diagram determination -- Order-disorder transformations -- Chemical analysis by X-ray diffraction -- Chemical analysis by X-ray spectrometry -- Measurement of residual stress -- Appendices -- General references -- Chapter references -- Answers to selected problems -- Index. |