Record Display for the EPA National Library Catalog


Main Title The development of potential thin standards for calibration of x-ray fluorescence spectrometry /
Author Pella, P. A.
CORP Author National Bureau of Standards, Washington, DC. National Measurement Lab.;Environmental Protection Agency, Washington, DC. Office of Research and Development.
Publisher National Bureau of Standards, Center for Analytical Chemistry : U.S. Environmental Protection Agency, Office of Environmental Engineering and Technology ; National Technical Information Service [distributor],
Year Published 1980
Report Number EPA/600-7-80-123
Stock Number PB80-220239
OCLC Number 08349920
Subjects Thin films. ; Fluorescence spectroscopy.
Additional Subjects Gas analysis ; X ray spectrometers ; X ray fluorescence ; Standards ; Calibrating ; Sampling ; Thin films ; Air pollution ; Glass fibers ; Chemical analysis ; Air pollution detection
Internet Access
Description Access URL
Library Call Number Additional Info Location Last
EJBD ARCHIVE EPA 600-7-80-123 Headquarters Library/Washington,DC 09/12/2011
EJBD  EPA 600-7-80-123 c.1 Headquarters Library/Washington,DC 06/04/2013
NTIS  PB80-220239 Some EPA libraries have a fiche copy filed under the call number shown. 07/26/2022
Collation vii, 39 pages : illustrations ; 28 cm.
Thin films containing known concentrations of metals are important for the calibration of X-ray Fluorescence Spectrometry (XRF), especially for the analysis of collected airborne particulate matter. A focused ion-beam sputtering technique has been investigated as a candidate method for fabricating thin glass films containing know concentrations of metals on polycarbonate substrates. Glass targets were fabricated at NBS for these studies, and parameters such as ion-acceleration voltage and ion current were systematically varied to determine any changes in film composition. It was found that rather severe changes in instrumental parameters do not affect the elemental composition of the films appreciably. Up to eight substrates were coated at one time and the compositional reproducibility as measured by XRF for Si, Ca, Zn, and Pb for 13 samples was within five percent relative standard deviation at mass loadings of glass from 160 190 micrograms/cm. Glass films containing phosphorous and sulfur were also prepared to demonstrate the feasibility of preparing glass films containing such elements of low atomic number. Additional studies consisted of the deposition of finely ground synthetic glasses on membrane filters, and the characterization of some selected commercial thin films prepared by thermal evaporation.
"June 1980." "EPA/600-7-80-123." Includes bibliographical references. Contract no.: EPA-IAG-D8-E684.