Record Display for the EPA National Library Catalog
RECORD NUMBER: 1 OF 43Main Title | A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films / | |||||||||||
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Author | McCrackin, F. L. ; McCrackin, Frank L. | |||||||||||
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Publisher | National Bureau of Standards, | |||||||||||
Year Published | 1964 | |||||||||||
OCLC Number | 09472785 | |||||||||||
Subjects | Thin films--Optical properties ; FORTRAN (Computer program language) ; Solid film--Optical properties | |||||||||||
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Collation | ii, 42 pages : diagrams ; 26 cm. | |||||||||||
Notes | Includes bibliographical references. Issued May 27, 1964. |