Record Display for the EPA National Library Catalog
RECORD NUMBER: 4 OF 10Main Title | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis / | |||||||||||
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Author | Echlin, Patrick. | |||||||||||
Publisher | Springer, | |||||||||||
Year Published | 2009 | |||||||||||
OCLC Number | 248979308 | |||||||||||
ISBN | 9780387857305 (acid-free paper); 0387857303 (acid-free paper) | |||||||||||
Subjects | Scanning electron microscopy--Technique ; X-ray microanalysis--Technique ; Elektronenstrahlmikroanalyse ; Rasterelektronenmikroskopie ; Scanning electron microscopy ; X-ray microanalysis ; Elektronenstrahlmikroanalyse--(DE-588)4151898-6 ; Rasterelektronenmikroskopie--(DE-588)4048455-5 | |||||||||||
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Collation | xi, 330 p. : ill. (some col.) ; 27 cm. | |||||||||||
Notes | Includes bibliographical references (p. 317-322) and index. |
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Contents Notes | Sample collection and selection -- Sample preparation tools -- Sample support -- Sample embedding and mounting -- Sample exposure -- Sample dehydration -- Sample stabilization for imaging in the SEM -- Sample stabilization to preserve chemical identity -- Sample cleaning -- Sample surface charge elimination -- Sample artifacts and damage -- Additional sources of information. |