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Main Title Chemometrics : theory and application : a symposium /
Author Kowalski, Bruce R.
Other Authors
Author Title of a Work
Kowalski, Bruce R.
CORP Author American Chemical Society. Division of Computers in Chemistry.
Publisher American Chemical Society,
Year Published 1977
OCLC Number 03071821
ISBN 0841203792; 9780841203792
Subjects Chemistry--Data processing--Congresses. ; Chemie--(DE-603)085018961--(DE-588c)4009816-3 ; Datenverarbeitung--(DE-603)085022594--(DE-588c)4011152-0
Additional Subjects Chemistry--Data processing--Congresses
Internet Access
Description Access URL
Library Call Number Additional Info Location Last
EJEM  QD39.3.E46C48 1977 OCSPP Chemical Library/Washington,DC 12/17/2004
Collation viii, 288 pages : illustrations ; 24 cm.
Includes bibliographical references and index.
Contents Notes
Advances in the application of optimization methodology in chemistry / Stanley N. Deming and Stephen L. Morgan -- ARTHUR and experimental data analysis: the heuristic use of a polyalgorithm / A.M. Harper, D.L. Duewer, B.R. Kowalski, and James L. Fasching -- Abstract factor analysis : a theory of error and its application to analytical chemistry / Edmund R. Malinowski -- The unique role of target-transformation factor analysis in the chemometric revolution / Darryl G. Howery -- Application of factor analysis to the study of rain chemistry in the Puget Sound region / Eric J. Knudson, David L. Duewer, Gary D. Christian, and Timothy V. Larson -- Analysis of the electron spin resonance of spin labels using chemometric methods / James R. Koskinen and Bruce R. Kowalski -- Automatic elucidation of reaction mechanisms in stirred-pool controlled-potential chronocoulometry / Louis Meites and George A. Shia -- Examples of the application of nonlinear regression analysis to chemical data / Y.C. Martin and J.J. Hackbarth -- A computer system for structure-activity studies using chemical structure information handling and pattern recognition techniques / A.J. Stuper, W.E. Brugger, and P.C. Jurs -- Enthalpy-entropy compensation : an example of the misuse of least squares and correlation analysis / R.R. Krug, W.G. Hunter, and R.A. Grieger-Block -- How to avoid lying with statistics / Allan E. Ames and Geza Szonyi -- SIMCA : a method for analyzing chemical data in terms of similarity and analogy / Svante Wold and Michael Sjèostrèom.